Used ACCRETECH / TSK UF 200 #9233248 for sale

ACCRETECH / TSK UF 200 is a prober designed for the detection, analysis and characterization of devices. It is particularly well-suited for semiconductor wafer and DRAM (Dynamic Random Access Memory) chip testing, and is applicable in a wide range of research and development (R&D) as well as production environments. TSK UF 200 is equipped with a high resolution 100X optical microscope and a high-resolution CCD (Charge Coupled Device) camera to capture surface images and images of defective sites. It also contains a micropositioner stage with X, Y and theta axes, and a 3D non-contact optical microscope. ACCRETECH UF200 has a 4-inch wafer capacity, and a maximum pressure of 10 psi/5 Bar. It is also equipped with a vacuum chuck mechanism and SEM (Scanning Electron Microscope) imaging mode. UF 200 features real time fail-analysis with a quick defect mapping algorithm for tracking and identifying defects. It also includes a data capture equipment which includes a quick-access database for wafer map and fail log history, for improved traceability and failed device characterization. UF200 operates on a pair of 12-bit dual analog servo motors combined with a variety of types of probe cards and other sensors to analyze a variety of parts. It features an exotic digital image processor, multi-dimensional registration capabilities, and FFT (Fast Fourier Transform). Its advanced vision system analyzes and processes device information, while a dedicated CCD/camera provides immediate feedback on test results and actionable item recording. This makes ACCRETECH UF 200 well-suited for a wide range of semiconductor device defect detection and analysis applications. TSK UF200 is built for reliability and high performance. It features environmental management using ozone concentration and deionizing filters, providing a contaminant-free specimen surface for reliable observations. In addition, it comes with temperature control for temperature sensitive specimens. ACCRETECH / TSK UF200 is also backed by TSK comprehensive product warranty and service package. In conclusion, ACCRETECH / TSK UF 200 is an advanced prober designed for detection, characterization and analysis needs in semiconductor and DRAM device testing. It features a host of high-end features, including a data capture unit with real-time fail-analysis and quick defect mapping algorithms. Its advanced vision machine and digital image processor provide reliable results, while its built-in temperature control and ozone filter provide an environment suitable for temperature sensitive specimens.