Used ACCRETECH / TSK UF 200 #9235938 for sale

ACCRETECH / TSK UF 200
Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 9235938
Vintage: 2003
Prober Manipulator: MHF300L Stage chuck: Gold chuck Temperature control: Hot chuck Frequency band chuck temperature: 30°C~151°C Cleaning unit type: Aluminum pad (120mm x 60mm) CPU Board version: MVME-162 Ethernet Slot number / Boards Slot 1 / CPU Slot 4 / VGAC Slot 6 / COGNEX Slot 8 / PIO Slot 10 / TTL/GP-IB Slot 11 / 5CH PGEN Slot 14 / CAP Sensor Slot 16 / AVME Slot 17 / LD. IO Slot 18 / LD. PGEN ETC: COGNEX Board version: 4300 External media: FDD 2003 vintage.
ACCRETECH / TSK UF 200 is a prober designed and manufactured by Technical Standard KK and is suitable for a variety of prober applications in the semiconductor and electronics industries. It is a high-precision tool that can perform a variety of complex processes, including probing, inspection, and cleaning, among others. The prober is composed of a tool frame, probe cards, drive unit, XYZ moving stage, and a controller. The tool frame is made to be extremely rigid in order to ensure accurate probing and measurements. The probe cards are designed to hold the probes and also provide electrical connections to the controller. The drive unit is responsible for moving the XYZ stage in a precise manner, with step-and-repeat capability. The XYZ stage has a high precision 4-axis motion capability with an accuracy rating of 0.0002 inches. It also contains an automatic pitch adjustment option, to correct pitch and rotation values throughout the probing process. The prober boasts an adjustable probing force range of 0-15 grams and its wafer chuck is designed to handle wafers with a variety of sizes, including 200mm and 300mm. The prober can also handle wafer thicknesses of up to 0.25mm. The controller is a highly customizable device that can be set up to meet the specific needs of the user. It includes features such as data logging, run groups, and diagnostics. TSK UF 200 is a highly accurate and efficient prober that is suitable for a variety of applications. It is capable of performing a wide range of probing and inspection tasks and has the ability to handle wafer sizes of up to 300mm. The device features a highly accurate XYZ stage with an accuracy rating of 0.0002 inches and steps-and-repeat capability. Its adjustable probing force range of 0-15 grams ensures precise probing and inspection processes. The highly customizable controller further adds to the device's flexibility and user friendliness.
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