Used ACCRETECH / TSK UF 200 #9235938 for sale
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ID: 9235938
Vintage: 2003
Prober
Manipulator: MHF300L
Stage chuck: Gold chuck
Temperature control: Hot chuck
Frequency band chuck temperature: 30°C~151°C
Cleaning unit type: Aluminum pad (120mm x 60mm)
CPU Board version: MVME-162
Ethernet
Slot number / Boards
Slot 1 / CPU
Slot 4 / VGAC
Slot 6 / COGNEX
Slot 8 / PIO
Slot 10 / TTL/GP-IB
Slot 11 / 5CH PGEN
Slot 14 / CAP Sensor
Slot 16 / AVME
Slot 17 / LD. IO
Slot 18 / LD. PGEN
ETC:
COGNEX Board version: 4300
External media: FDD
2003 vintage.
ACCRETECH / TSK UF 200 is a prober designed and manufactured by Technical Standard KK and is suitable for a variety of prober applications in the semiconductor and electronics industries. It is a high-precision tool that can perform a variety of complex processes, including probing, inspection, and cleaning, among others. The prober is composed of a tool frame, probe cards, drive unit, XYZ moving stage, and a controller. The tool frame is made to be extremely rigid in order to ensure accurate probing and measurements. The probe cards are designed to hold the probes and also provide electrical connections to the controller. The drive unit is responsible for moving the XYZ stage in a precise manner, with step-and-repeat capability. The XYZ stage has a high precision 4-axis motion capability with an accuracy rating of 0.0002 inches. It also contains an automatic pitch adjustment option, to correct pitch and rotation values throughout the probing process. The prober boasts an adjustable probing force range of 0-15 grams and its wafer chuck is designed to handle wafers with a variety of sizes, including 200mm and 300mm. The prober can also handle wafer thicknesses of up to 0.25mm. The controller is a highly customizable device that can be set up to meet the specific needs of the user. It includes features such as data logging, run groups, and diagnostics. TSK UF 200 is a highly accurate and efficient prober that is suitable for a variety of applications. It is capable of performing a wide range of probing and inspection tasks and has the ability to handle wafer sizes of up to 300mm. The device features a highly accurate XYZ stage with an accuracy rating of 0.0002 inches and steps-and-repeat capability. Its adjustable probing force range of 0-15 grams ensures precise probing and inspection processes. The highly customizable controller further adds to the device's flexibility and user friendliness.
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