Used ACCRETECH / TSK UF 200 #9235940 for sale

ACCRETECH / TSK UF 200
Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 9235940
Vintage: 2003
Prober Manipulator: MHF300L Stage chuck: Gold chuck Temperature control: Hot chuck Frequency band chuck temperature: 30°C~152°C Cleaning unit type: Aluminum pad (120mm x 60mm) CPU Board version: MVME-162 Ethernet Slot number / Boards Slot 1 / CPU Slot 4 / VGAC Slot 6 / COGNEX Slot 8 / PIO Slot 10 / TTL/GP-IB Slot 11 / 5CH PGEN Slot 14 / CAP Sensor Slot 16 / AVME Slot 17 / LD. IO Slot 18 / LD. PGEN ETC: COGNEX Board version: 4300 External media: FDD 2003 vintage.
ACCRETECH / TSK UF 200 is a benchtop prober designed for ultra-fine probing of semiconductor devices. This prober is suitable for testing a wide range of devices, including MEMS devices, high-aspect-ratio contact arrays, and fine-pitch devices. TSK UF 200 features a unique three-phase coarse-fine alignment system and XY manipulation of the prober. This enables fast and accurate placement of the device and probe contact to the sample. It has a load capacity of up to 200 milligrams, and its wear resistant cantilever design allows for long-term reliability. The prober is capable of a wide range of tests, including shorts, bridging, leakage and contact resistance. It can also be used for failure analysis, repair, and product binning. ACCRETECH UF200 features an LED controller with high-resolution adjustment capability and user-defined module-specific settings. This allows for efficient and repeatable performance with minimal operator training. It also has an advanced scanning capability. This scan size and step size can be set automatically and/or manually to perform the most accurate measurements. The prober is able to scan over a wide range of temperatures and has an integrated temperature control unit. This permits testing of samples up to 250°C. It features an adjustable contact force range, which is used to ensure a consistent contact force while testing. It is equipped with a Laser AFM and Magnified Close Up Mode, which allow for precision measurement of solder bumps, as well as thin metal layers. UF 200 is supported by a variety of software options. Its Accreteck's ProbeGauge software provides powerful data analysis and process optimization through real-time measurements. It also offers various report options to improve traceability, such as custom PDF output. Overall, ACCRETECH / TSK UF200 is an advanced prober designed for ultra-fine probing of a wide range of devices. Its precision alignment system and adjustable settings, along with its three-phase scanning technology, make it an ideal tool for testing delicate and/or complex devices. It also offers excellent temperature control and reporting capabilities that help ensure accuracy and repeatability.
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