Used ACCRETECH / TSK UF 200 #9243572 for sale

ACCRETECH / TSK UF 200 is a semiconductor prober designed for the electrical probing of a wide range of microelectronic devices. It offers automated probing, testing and verification of a variety of components, including microprocessors, DRAMs, FPGAs and accelerators. TSK UF 200 is a high precision, high-speed electro-mechanical prober. It has a modular configuration that comprises a wafer headstage, sample handler and probe stage. The wafer headstage is a U-shaped fixture that allows for the positioning of a semiconductor device in a reliable and repeatable way. It has an adjustable 3-point reference system for optimal alignment and calibration. The sample handler is a robotic arm that transfers individual devices from the wafer head to the probe stage. It allows for the accurate placement of a semiconductor device in the optimal position for probing. The probe stage contains the electrical probing mechanism. It comprises several types of probes including four-point probes, anchored probes and retractable probes. The probes are mounted on a rotary stage and can be moved in a predefined sequence in order to reduce the number of probing operations. The probes can be replaced quickly and easily, and features such as collision protection are activated to protect the probes and the device being probed. ACCRETECH UF200 has a 25 watts power supply, a DC sweeping capability, and a frequency range of up to 5GHz. It is also equipped with a built-in data logger that records test results independently of the system operating software. This allows the results to be accessed remotely using an Ethernet or USB interface. ACCRETECH / TSK UF200 is capable of probing a wide range of devices quickly and accurately. Its integrated design combined with its advanced features makes it an ideal tool for a number of applications. It is also easily configurable and can be tailored to the specific needs of each customer. UF200 is a robust, reliable and cost-effective solution for the testing and verification of microelectronic devices.