Used ACCRETECH / TSK UF 200 #9255178 for sale

ACCRETECH / TSK UF 200 prober is a high-precision wafer probing equipment designed for modern semiconductor manufacturing. It features advanced digital signal processing (DSP) technology to maximize probing speed and accuracy. It is also equipped with an automated pad finder to facilitate test pad detection. TSK UF 200 has a software-defined precision control system which tracks and fine-tunes the motion of the probe. This ensures accurate material handling, even on substrates up to 200 mm in size. The unit also features a height control machine that ensures the tool head is maintained at a constant height to minimize distortion of the measured parameters. The prober is constructed with an anti-friction rail tool and a rigidly anchored test head to ensure a vibration-free environment. It is also designed with a thermal control asset to maintain consistent detector temperature. This allows for accurate placement and orientation of the probe during testing. To ensure accurate measurement, ACCRETECH UF200 is equipped with a high-precision positioning model. This equipment uses position markers to determine the relative positions of the probe tip and its corresponding target test point. It also uses an ultrasonic system to enable probing to prescribed depths. The unit also features an automated wafer handling arm to reduce the risk of contamination and enable specifications to be adjusted depending on the wafer geometry. UF200 is further equipped with a variety of detectors that can measure resistance, capacitance, and other parameters. UF 200 is capable of operating in ultra-high vacuum, enabling measurements in harsh environments such as those found in the semiconductor manufacturing process. It is also designed with a highly reliable software library to support multiple-device measurements. In addition, the machine has an interactive graphical user interface for easy operation and data access. ACCRETECH / TSK UF200 is a highly accurate and versatile prober tool that is ideal for semiconductor testing and measurement requirements. It is robustly built to withstand the rigors of modern manufacturing processes, while its features of accurate positioning, wafer handling, and high-performance detectors enable accurate probing with minimal risk.