Used ACCRETECH / TSK UF 200 #9255180 for sale

ACCRETECH / TSK UF 200 is a prober that has been designed and developed to meet the most comprehensive and stringent requirements for semiconductor IC testing across numerous IC types and production lines. This prober provides precision test and probing capabilities for high-performance circuit and package components. The equipment is designed to satisfy the requirements of all IC manufacturing processes. It is capable of generating high-speed depth probing, fine feature probing and process control probing. In addition, its large working area and high sample station space can accommodate all kinds of ICs, including BGA, μBGA, and TSOP. The system has a wide dynamic probing range, meeting the demands of a variety of design requirements including 0.020", 0.50mm and 01.27mm semiconductor probes, probe cards and fixtures. Moreover, it has various alignment and measurement options, so that faster testing and improved yield can be obtained. The unit features a high-speed data acquisition, providing maximum flexibility and accuracy while minimizing the manual hand-editing required. This prober can also be connected to third-party devices, such as probers and measurement systems, in order to facilitate data acquisition and processing. Additionally, it features a user-friendly interface, allowing the user to set up, monitor and customize testing parameters. The machine is able to transport samples from a drive to a test tool with precision, diminishing the need for manual loading times and instances. This feature allows for a much higher quantum of wafer-level testing. Furthermore, the asset is highly automated and involves a combination of automated test parameters, stream activity, and real-time error-checking for improved accuracy. The model also offers accurate feedback values for the end-users in a way that does not impede the testing process. This prober is designed to endure the rigors of a production environment, ensuring that sampling proceeds at a steady and efficient rate. Moreover, it comes with a comprehensive control equipment that allows comprehensive control over the IC testing process. This system can be used to monitor the exact measurement of up to 65,536 test points at a single time with its built-in data transfer capabilities. All in all, TSK UF 200 prober is an efficient and reliable solution for IC testing and probing.