Used ACCRETECH / TSK UF 200 #9255185 for sale

ACCRETECH / TSK UF 200 is a versatile and highly advanced prober for the study of electrical and device testing. It is an ideal equipment for probing a wide variety of cell designs with a comprehensive range of probing probes and heads. TSK UF 200 offers accurate and reliable probing of wafer under test (WUT) with a broad selection of probe cards including 600 to 1120 Voltage output (VOUT)-based cards, 4000 to 8000 currents (I/Os) based cards and current sensing low-level sensing I/Os (CLS) based cards. Its probe movement system is designed with high-resolution accuracy, giving it the ability to precisely position probes on the WUT with repeatable accuracy. It comes with an easy-to-use Graphical User Interface (GUI) that allows users to quickly and efficiently make adjustments and to monitor probe activities. The prober is also equipped with advanced diagnostic tools to detect various types of errors, preventing unexpected failures and providing debugging tips to new users. The prober includes an ATE Controller, Probe Probe Positioning Unit, Probe Head Optimizer and Probe Card Optimizer for further enhancing the accuracy and real-time performance of the machine. The probe heads operate with a very low input noise level and can measure signals with millisecond response times. ACCRETECH UF200 is able to handle a large range of devices and can make probe moves faster than any other prober on the market. Moreover, the machine provides up to 9,999 combinatorial patterns with a high degree of precision when examining tasks like yield monitors and size printers. The tool can also be programmed in a very detailed manner and with sufficient flexibility to ensure that the wafers can be examined in an optimum way. Overall, ACCRETECH / TSK UF200 is an advanced prober that provides an excellent solution for a wide variety of device testing applications. It is highly accurate and efficient and offers maximum operational speed and flexibility. The prober also supports an extensive variety of probe cards and heads, making it ideal for most kinds of testing in different types of devices.