Used ACCRETECH / TSK UF 200 #9255206 for sale

ACCRETECH / TSK UF 200 is a prober specifically designed for semiconductor device testing. It is a universal testing equipment which can be used for both wafer test and package probing. It is an advanced system which can provide users with an efficient and accurate measurement of the electrical properties of integrated circuits. TSK UF 200 prober can be configured to support a wide range of different application requirements, such as Probing, Wedge-Bonding, and Wafer-Bonding. Its configuration and flexibility allow for a high degree of customisation for different types of applications. ACCRETECH UF200 is equipped with two distinct types of probes which include the Scanning and Contact probes. The Scanning probe can measure a large number of points on the wafer surface and is used for creating a map of the electrical properties of each point on the wafer surface. The Contact probe is used for measurements at a fixed point on the wafer surface, and is ideal for high-accuracy measurements of the electrical characteristics of specific devices. Additionally, UF 200 offers several advanced features and options to help users obtain high-precision measurements quickly and accurately. It has an easy-to-use graphical user interface, which can be used to control and program the scanning and contact probes. It also features a full range of diagnostic capabilities which allow the user to diagnose device defects and evaluate changes in electrical characteristics over time. Furthermore, UF200 has a highly reliable architecture, offering users a high degree of reliability and accuracy when taking measurements. It has a robust operating unit with ERMTM technology, which is designed to prevent errors and improve machine stability. Additionally, its design enables users to obtain high-precision measurements quickly and accurately. Overall, ACCRETECH / TSK UF200 is a highly advanced prober that is designed to provide users with an efficient and accurate measurement of the electrical properties of integrated circuits. It is extremely reliable and offers a wide range of diagnostic capabilities that allow users to diagnose device defects and evaluate changes in electrical characteristics over time. With its easy-to-use graphical interface and highly reliable architecture, it is well-suited for a wide range of demanding applications.