Used ACCRETECH / TSK UF 200 #9260034 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 9260034
Wafer Size: 8"
Prober, 8" Top and bottom OCR Up to 150°C Clean pad Boot ROM version: 01.07.00.
ACCRETECH / TSK UF 200 is a prober solution specifically designed to meet the demands of the semiconductor industry. It is a fully automated wafer probing system that offers highly precise measurement accuracy, faster probing times and reliable test performance. TSK UF 200 is capable of handling wafer sizes ranging from 200mm-300mm, providing a high resolution optical microscope for process development, quality control and failure analysis. It can simultaneously measure up to 32 pins for highly accurate results. ACCRETECH UF200 also provides several probe technologies to support different types of wafers. These probe technologies enable the measurement of physical, electrical, and chemical characteristics of the wafer, from micron-scale to several millimeters. For physical properties, UF 200 has an AFM (Atomic Force Microscopy) and SEM (Scanning Electron Microscopy) capabilities. AFM enables users to determine the topology and smoothness of a sample down to the atomic scale, while SEM provides high-resolution images of both surface and subsurface details of wafers. Electrical characteristics, such as electrical resistance, can be measured by FIB (Field Ion Microscope), while ACCRETECH / TSK UF200 also supports CV and IV techniques for more robust electrical testing. With these various techniques, TSK UF200 can measure recombination centers, Shockley-Read-Hall parameters and interface state densities among other things. Chemical properties, such as oxidation states or chemical states present on the wafer's surface, can be measured by making use of ACCRETECH UF 200's Auger Electron Spectroscopy (AES) capabilities. AES enables users to understand the chemical composition of the wafer being probed, thereby allowing for further understanding in terms of process development and failure analysis. Overall, UF200 is a high-performance wafer prober solution that comes with multiple technologies to measure various physical, electrical, and chemical characteristics of semiconductor wafers. It is a powerful, fully automated tool that delivers highly reliable and accurate measurement results in the semiconductor industry.
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