Used ACCRETECH / TSK UF 200 #9270836 for sale

ACCRETECH / TSK UF 200 Prober is a precision silicon probing system for the testing of components on Si wafers. This precision instrument is designed for R&D and production testing applications that require accuracy and repeatability. It has a high-resolution optical CCD microscope that has a 12x zoom, providing superior image quality. TSK UF 200 also features an advanced die-aligner system, which enables real-time adjustment of the probe card position to ensure that it is aligned to the device under test. ACCRETECH UF200 has an integrated four-point probe that is designed to measure open circuit resistance and capacitance on components. It also has an optional current source and measurement programmable mode. This feature allows the user to better observe small changes in the device's current in the form of a graph or waveform. This can help diagnose working condition issues or verify current consumption from device temperature tests. UF 200 features an intuitive, user-friendly GUI which allows for fast, efficient programing, setup, and operation. It supports several API activities such as serial communications and multiple programming languages. This allows for integration and automation into a variety of processes, including parallel, simultaneous tests on multiple dies, or combinations of tests on a single die. This prober is built for fast wafer probing and handling, with a cycle time of just 0.25 seconds. It is extremely accurate and highly repeatable, with a precision resolution of 3 μm, an accuracy of ±1 μm, and a repeatability of 1 μm. This allows users to trust their results and ensure they are testing to repeatable, uniform conditions. UF200 can also be used in a high-vacuum environment as it is designed to withstand a maximum operating pressure of 3.0 mbar. This is suitable for most applications, but it is also possible to use custom systems in higher-pressure ranges. Overall, ACCRETECH UF 200 Prober is an incredibly accurate, fast, and efficient solution for R&D and production testing of components on Si wafers. Its high-resolution microscope, advanced die-align system, and intuitive GUI make it easy to program and use, while its fast cycle time and precision resolution make it repeatable, reliable, and trustworthy.