Used ACCRETECH / TSK UF 200 #9283854 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 9283854
Vintage: 1997
Prober Platform: J750 / J750 EX 1997 vintage.
ACCRETECH / TSK UF 200 is a prober designed for high-throughput electrical testing of semiconductor devices. This prober is suitable for testing a wide range of semiconductor devices, including transistor-level, flip-chip, and memory modules. It has a probing system consisting of four probes and four independent channels of measurement, enabling simultaneous testing of multiple devices. The prober uses a proprietary vertical force measurement technology, which ensures that the probes remain in contact with the devices under test and that no false contact is made. The advanced probe alignment and contact force control system (AFCC) provides precise, high-accuracy results. The prober is also equipped with Accro-Touching, a patented automatic device touching system, and Frequency Response Analysis, which enables the rapid and accurate measurement of dynamic device characteristics. TSK UF 200 prober is offered in a high-speed configuration, with a fast response time for accurate, repeatable measurements and a large alignment range for testing a wide variety of device types. The prober has an intuitive user interface, with a built-in Intuitive Programming and an Image Compensation feature for highly accurate positioning. It is also equipped with an advanced Fault Analyzer and a powerful Pass/Fail analyzer for comprehensive testing. ACCRETECH UF200 can accommodate various automated tests such as on-board evaluation, testing of analog and digital devices, as well as high-speed memory devices. It has an integrated software platform, and is compatible with a range of third party software packages and test suites. Moreover, the prober is equipped with advanced safety features and is certified to conform to ISO 9001, ISO 14001, and CE standards. ACCRETECH UF 200 prober is an ideal solution for high-volume production, reliability testing, and failure analysis. It is capable of performing high throughput testing of a variety of semiconductor devices with the utmost accuracy, offering cost-effective testing solutions, and high-quality results.
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