Used ACCRETECH / TSK UF 200 #9283859 for sale

ACCRETECH / TSK UF 200 is a precise, high-performance prober designed for semiconductor test applications. It is designed to meet the needs of various industries and market sectors, such as a wide range of semiconductor device and integrated circuit testing. TSK UF 200 is equipped with two Z-direction stages for precise wafer-level packaging measurements. The Z stages can be configured to provide the precise vertical displacement needed to make measurements on die surfaces down to 100µm. The equipment is also equipped with a TSK motorized XY stage which provides precise sample position repeatability and accuracy. ACCRETECH UF200 features high-powered XYZ stages and a clamping system that ensures precise sample handling. The unit provides a wide measuring range in the X-Y-Z directions of up to 200 mm and can be controlled by either a manual joystick or an intuitive, integrated touchpad-style control. The integrated joystick enables users to view and manipulate the probe head in three dimensions. Onboard software configurations available include CDM Probe Data Management, PRMS Probe Auto-Alignment and CDM-Touch Scan software. UF200 comes equipped with an optical column and camera machine for inspection and imaging. The optical tool provides high-resolution, colour-corrected imaging with a wide field of view. The advanced imaging asset provides automatic and manual focus adjustment for clear, sharp images every time. ACCRETECH UF 200 also comes with an integrated test stand which can be used to properly align and secure your sample before testing. In addition, TSK UF200 supports a wide range of probe and cantilever configurations which makes it suitable for testing a variety of material configurations. The prober is also equipped with an advanced data acquisition model, providing sophisticated analysis of contact conditions, alignments and probing conditions, which helps users achieve accurate, reliable and repeatable data results. Overall, ACCRETECH / TSK UF200 is a high-precision prober that is suitable for a range of semiconductor device and integrated circuit testing applications. It features a robust, intuitive design and offers high accuracy, repeatability, and reliability.