Used ACCRETECH / TSK UF 200 #9283875 for sale

ACCRETECH / TSK UF 200 is a prober designed for wafer level probing, measuring and testing of a wide variety of semiconductor devices. TSK UF 200 is designed to meet the demands of complex wafer-level process control applications. It uses a combination of dual microscope imaging and wafer level probing to allow users to visualize and measure features down to 100 nanometers. ACCRETECH UF200 is built with a unique four-axis motorized stage, which is optimized for high-speed accuracy while maintaining a stable platform that is reliable and accurate. This makes it ideal for direct inspection of small devices. The motorized stage can move and align in both the X and Y directions in a high-speed and very precise manner, and is compatible with various wafer slot frame types with a large capacity of measuring parameters. UF 200 also comes with an integrated optical microscope that is equipped with a visible light image sensor. The image sensor is capable of capturing and displaying surface topology images via an internal CCD camera. Additionally, this microscope has a built-in auto-focus function and illumination means for gathering the highest quality images available. This provides customers more accurate results, with smaller feature sizes, when probing and measuring their device structures. As part of UF200 package, it comes with two integrated probe heads, each one with a scanning resolution 3 milligrams. This makes it ideal for probing features as small as 100 nanometers, with each head featuring a dedicated auto-chuck for quick and easy attachment. With the dual head design, sample layout can be reduced significantly, leading to faster probing times and increased throughput. TSK UF200 also has advanced probing capabilities, allowing users to accurately measure and test devices on an atomic level. This enables them to detect and analyze device defects, including junction leakage, process variations, and other device characteristics. To further increase accuracy and improve data analysis, ACCRETECH UF 200 comes with a powerful software package, allowing for real-time data acquisition and the generation of data reports. The software also provides powerful image processing and analysis capabilities that enable the user to detect and analyze data at a fast rate, which helps in process control and defect analysis. Finally, ACCRETECH / TSK UF200 also features a unique vibration and temperature control system, ensuring maximum accuracy of readings while eliminating distraction from external sources. This makes it particularly suitable for automated, reliable, and repeatable data collection.