Used ACCRETECH / TSK UF 200 #9284011 for sale

ACCRETECH / TSK UF 200 is a prober designed for testing and evaluating integrated circuits (ICs) and opto-electronic devices. The prober provides a thorough measuring solution for providing both electrical and non-electrical characteristics into-one testing platform. It is equipped with the unique "Dual recognition equipment" which allows testing and evaluation of both chips and opto-electronic devices. The prober offers a variety of features that allow for high precision measurements in a short period of time. It is equipped with an Ultra-High speed data communication system with supporting software that allows the execution of job data and evaluation results to be recorded and retrieved quickly. The prober also has a highly adaptable and integrated modular hardware configuration. This allows users to customize the unit to their specific needs without expensive hardware conversion kit costs. The prober offers an mechanical axis machine to allow for precise movement and positioning of the testing tool. It also offers a XYZ3D Laser-Extraction Tool that offers repeatable accuracy, fast and upper-to-lower corners data exchange. This feature offers improved accuracy and reduced testing time. The "KV Altering Asset" offers a variety of measurements and adjustments of the device, while a "Tool-free Contactor Model" allows quick and easy switching of the contacts without any manual interaction. The prober also offers a "Tip Module Equipment" which provides a unique and economic protection feature. This system helps protect from malfunction during contact/probe movement, which can cause short-circuits or over-voltage. TSK UF 200 prober provides users with an efficient and highly reliable measuring solution for testing and evaluating both ICs and opto-electronic devices. It offers a wide range of features that help reduce testing time and offer increased accuracy. It also offers an easy-to-use modular hardware configuration for customized setup and support for various tests and evaluation. It is a suitable solution for IC/opto-electronic device development through production.