Used ACCRETECH / TSK UF 200 #9353019 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200
ID: 9353019
Prober.
ACCRETECH / TSK UF 200 is a single-head prober designed for testing semiconductor device samples. The prober features an optimized automated test equipment capable of high-speed probing, an air-bearing motion system for increased accuracy and a modular design for easy configuration. TSK UF 200 is designed for automated, high-speed probing of individual semiconductor device samples, enabling quick and easy setup, operation and maintenance. ACCRETECH UF200 utilizes an advanced, closed-loop motion control unit, featuring an ultra-precise air-bearing machine for nanometer-level accuracy and repeatability of sample placement. This tool allows UF 200 to quickly and accurately perform wafer probing, even in complex and demanding production environments. Furthermore, TSK UF200 utilizes a modular platform, enabling it to be easily configured to suit a wide variety of semiconductor device testing needs. This modularity allows ACCRETECH UF 200 to easily be connected to other laboratory instrumentation and test systems. It also allows for the flexibility to integrate a wide variety of sensors and measurement tools for improved test accuracy and repeatability. In addition, the automated test asset of ACCRETECH / TSK UF200 uses a finely-tuned, high-speed mechanical probing process, reducing wait time and achieving a highly accurate test result. This model can be adapted to a variety of testing needs, making it a great choice for automated probe testing of multiple devices. Finally, UF200 is highly reliable and user-friendly, making it easy to use in a wide range of automated testing environments. ACCRETECH / TSK UF 200's specialized electronics, accurate motion control and intuitive user interface allow for quick and easy operation, minimizing manual intervention and minimizing sample testing time. Built on a robust platform, TSK UF 200 ensures long-term reliability and repeatability, making it a great choice for any semiconductor device testing needs.
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