Used ACCRETECH / TSK UF 200 #9355488 for sale

ACCRETECH / TSK UF 200 is a high speed prober specifically designed to meet the increasing demands of semiconductor test applications. This versatile prober offers a high speed, reliable performance with accurate repeatable results. TSK UF 200 combines several key features that help ensure its accuracy and reliability, while still providing a cost effective solution. The prober is designed to provide wafer probing at speeds of up to 200 wafers per hour. It employs a beltless design, which guarantees high speed and smooth movement of the wafers. The moving stages are driven by a direct linear motor and coupled with an advanced encoder system for real time repeatability and accuracy. To help reduce vibration and noise, the system is also outfitted with vibration dampening fixtures and acoustic covers. ACCRETECH UF200 is equipped with a 12" prober chuck, capable of handling wafers up to 200mm in size and up to 0.6mm thick. The Chuck is adjustable and can be rotated clockwise or anti-clockwise for probing different areas of the wafer. In addition, the chuck can be moved in X, Y, or Z directions to facilitate exact positioning of the probes. The prober is equipped with a variable frequency range of 3 to 6kHz giving the user the flexibility to customize probing frequency depending on the probing application. An indexing broaching mechanism with an array of specialized robots ensures repeatable performance. The robot is designed to allow easily interchangeable probes and pins, to meet the high throughput repeating test needs. It is powered by an advanced and user-friendly software package, developed to ensure smooth and accurate positioning. The software offers a fully graphical interface that allows easy customization of the probing profile and to define an impressive range of test parameters. The software can also be connected to remote monitoring systems, allowing for tests to be monitored and accessed from anywhere in the world. UF 200 is highly efficient, with a total transmission time for per wafer probing of less than a second and a wafer-to-wafer repeatability of ±1µm. The prober has been designed with superior levels of reliability and accuracy with a MTTF (Mean Time To Failure) of 800,000 hours. This guarantees an extended and trouble-free operation with minimal downtime.