Used ACCRETECH / TSK UF 200 #9363115 for sale

ACCRETECH / TSK UF 200 is a high-precision prober designed for accurately testing and probing various semiconductor devices. It is designed to work with ICs, FPDs, and other electronic devices, such as SOTs, CSPs, and SOICs. It features a closed-loop position control equipment with a motion control accuracy of 0.01 µm and a positional accuracy of 1 µm. The prober's stage has an X-Y movement of 150 mm x 150 mm and Z movement of 25 mm. It can handle substrates from 25 to 635 mm, and supports substrate sizes up to 75 mm × 75 mm for embedded ICs and up to 300 mm × 300 mm for flat panel displays. Additionally, the prober is capable of supporting substrates up to 500 mm in diameter for wafer level testing. The prober includes a 16-channel prober system controller with PC and PC card control. This makes the unit capable of providing both manual testing and automatic testing. Furthermore, the probe head design allows for quick and easy exchange of probes, reducing downtime. It is equipped with various interfaces, including Ethernet, USB, RS-232, and digital I/O ports. The prober has a maximum speed of 150mm/sec, with a settling time down to 200ms, and electromechanical feedback. It is also capable of automated wafer probing and features high precision with adjustable spring force. TSK UF 200 prober features an advanced Windows operating machine with a graphical user interface (GUI). The GUI provides an easy way to control and monitor the tool, and allows the user to access a host of features like automated probing, programmable test recipes, process control, and analysis. In conclusion, ACCRETECH UF200 prober is a high-precision prober that is capable of testing and probing various semiconductor devices. It includes a 16-channel prober asset controller with PC and PC card control, and an advanced Windows operating model with a graphical user interface (GUI). The equipment includes a closed-loop position control system with a motion control accuracy of 0.01 µm and a positional accuracy of 1 µm, and has a maximum speed of 150mm/sec, with a settling time down to 200ms, and electromechanical feedback. The probe is suitable for ICs, FPDs, and other electronic devices and supports substrates up to 75 mm × 75 mm for embedded ICs and up to 300 mm × 300 mm for flat panel displays.