Used ACCRETECH / TSK UF 2000 #293597227 for sale
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ID: 293597227
Vintage: 2008
Prober
Chuck: Nickel
High temperature
OCR: Type 6
GPIB
Operating system: Windows 2000
CPU 7509
2008 vintage.
ACCRETECH / TSK UF 2000 is a prober used in semiconductor device production procedures. This advanced model is known to have high repeatability and stability, providing reliable results. It is ideal for measuring thin wafers due to its max wafer thickness of 0.5mm. TSK UF 2000 also has a fast electronic scanning which rapidly sweeps to achieve a desired result. This prober is comprised of an operating unit and a prober unit. The operating unit is responsible for controlling the operations of the prober and is easily connected to a PC terminal for easy synchronized operations. The prober unit was designed to fully automate the probing process, from movement to initiating and ending data acquirement. To ensure accuracy and repeatability, the unit comes with an automatic adjustment for optimal contact force and a self-calibration process. To further enhance the accuracy and safety, an air amplifier can be attached to manage and adjust air flow. ACCRETECH UF2000 is user-friendly and comes with a comprehensive library of offline application software. The intuitive interface makes it easy to use with programmable and repeatable operations. All functions can easily be adjusted and adjusted automation settings can be configured on the unit. Additionally, the unit is compatible with the latest data acquisition software, allowing users to connect to any lab computer and acquire measurement data. TSK UF2000 prober is one of the leading tools used in the semiconductor industry. Its advanced technology, combined with its high reliability and accuracy, make it a powerful solution for wafer measuring procedures, providing reliable accuracy and repeatability. The programmable and repeatable operations make it user-friendly and the intuitive interface makes it easy to use. Irrespective of the number of tests required, this semi-automatic prober allows for fast, reliable and accurate measurements.
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