Used ACCRETECH / TSK UF 2000 #9234263 for sale

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Manufacturer
ACCRETECH / TSK
Model
UF 2000
ID: 9234263
Vintage: 2011
Prober Docked: ST6730A Probe card: Auto card changer Manipulator: HF: MHF4000S Chuck stage: Chuck: Ni Temperature: Hot chuck Temperature range: 30° C ~ 150° C Needle cleaning: Cleaning unit Size: 200 x 100 Tester I/F: GPIB CPU Type: 7509 Ethernet OCR Inker Board configuration: Slot / Board 1 / VME7509 Master CPU 4 / TTL/GP-IB 6 / MR-MC01-S101 SSC NET 7 / DAKT-04 2011 vintage.
ACCRETECH / TSK UF 2000 is a prober designed for wafer probing and chip testing. This prober model offers multiple features and functions ideal for testing and probing high performance integrated circuits during product development, qualification and rental applications. The prober features an exclusive Dual Tilt Work Head that covers the entire wafer coverage while utilizing both vertical and horizontal movements to increase the accuracy of wafer-level probing and testing. The prober also offers programmable x, y, z and theta axes of movement. Its advanced automated wafer mapping and individual die location scanning capabilities provide efficient wafer testing and probing capabilities. Additionally, its user-friendly graphical user interface (GUI) includes easy-to-follow step-by-step commands for wafer mapping and test programming. TSK UF 2000 has a die thickness detection system that automatically monitors the die pack height before each load/unload sequence, helping to eliminate false contacts as well as costly wafer damage caused by contact with foreign particles. The prober also offers a Seven-Axis Autoloader and Wafer Unloader that allows the user to select specific wafers or groups of wafers for testing. The prober has a range of on-board test equipment as well as connection ports to external test equipment. It has a high-precision alignment system that is capable of compensating for any misalignment between the die package and the wafer surface. These features enable users to obtain highly accurate and reliable probing results. In addition, the prober is also equipped with an easy-to-use macro language to help users customize their own test programs. ACCRETECH UF2000 prober is reliable and highly accurate as it utilizes advanced automation approaches and provides for a minimal need for operator intervention during wafer testing and probing. The robust design of the prober allows it to meet the demands of high-volume wafer testing and probing within very tight time frames. This prober is ideal for meeting the needs of industrial and research laboratories that require extremely accurate and reliable probing results during penetration.
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