Used ACCRETECH / TSK UF 2000 #9249622 for sale
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ID: 9249622
Wafer Size: 5"-8"
Vintage: 2011
Wafer probers, 5"-8"
Main control system: Pentium
Hard Disk Drive (HDD): 40 GB
Operating system: VxWorks
Temperature range: -40°C - 150°C
Head stage magnum
Magneto optical disk drive
(2) Cassette loaders for 25 wafers (5"-8")
COGNEX 8500 Vision system
Manual wafer inspection transfer unit
Dual robotic wafer transport arms
Pre-alignment stage unit
Capacitive non-contact displacement sensor
Color LCD control panel with touch panel switches
Chiller unit: ARTS-HS (ACCRETECH RAPID THERMAL SYSTEM HIGH SPEED)
Advanced wafer alignment unit
Dual (X & Y) moire scales
Nickel plated cold chucks, 8"
High rigidity Z stage
Alarm lamp pole
Align and PMI
Options:
Wafer ID recognition: Type 6 OCR (Top side only)
Needle cleaning: Block type (100mm x 200mm x Brush)
Probe mark inspection
Multi site parallel probing: 28 DUT
ACCRETECH GP-IB Interface
Remote terminal: Full remote control
System level change log
Ethernet interface
S2-93 Compliance
Smart PMI
Automatic PC changer
2011 vintage.
ACCRETECH / TSK UF 2000 is a prober designed for wafer testing and analysis. It is a fully automated and robotic wafer prober that offers complete control over wafer testing and analysis processes. TSK UF 2000 is capable of single and multi-site testing and analysis of wafers and can accommodate wafer sizes ranging from 12 to 300mm. It utilizes advanced, state-of-the-art technology to ensure consistent and reliable performance. The equipment is equipped with several components such as a 4-axis scanning drive stage, wafer handling robot, testhead/donut stage, mechanical chucking and a collision prevention system. The wafer handling robot helps in moving wafers from internal cassette slots to an external transfer station, and vice versa. The 4-axis scan drive stage enables accurate and reliable positioning of the wafer, even when high-speed testing is being performed. The testhead/donut stage assists in sample testing and offers a wide range of testing functions including thermal test, shear force test, AFM, nuclear magnetic resonance, and lithography. The mechanical chucking helps with accurate and reliable alignment of the wafer in the prober, enabling precise and consistent test results. The collision prevention unit helps with collision detection and provides a safe operating environment. Furthermore, ACCRETECH UF2000 is equipped with user friendly software that easily integrates with other prober and test software, enabling extended capabilities and flexibility. Overall, ACCRETECH UF 2000 is a robotic wafer prober that is great for wafer testing and analysis. Its advanced technology allows for reliable and accurate testing processes, while its user friendly software greatly enhances the flexibility and capability of the machine. It is a great tool for any professional working with wafers and should be considered when looking for a prober.
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