Used ACCRETECH / TSK UF 2000 #9251564 for sale
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ID: 9251564
Vintage: 2011
Prober, 5"-8"
ARTS-HS Thermal unit included
Temperature range: -40°C to +150°C
Main control system: Pentium 4, 2.0 GHz (P/N: 293100)
Hard Disk Drive (HDD): 40GB
Operating system: VxWorks (P/N: 247853)
UF2000 O/S Rev: S5.13.08 or higher
Magneto optical disk drive / USB (P/N: 247850)
Head stage for NEXTEST Magnum / TERADYNE J750 Adapter ring
(25) First and second cassette loader wafers (5"-8" Wafers)
Includes with PC unit :
COGNEX 8500 Vision system
Align and PMI
Manual wafer inspection transfer unit
Dual robotic wafer transport arms
Pre-alignment stage unit
Capacitive non-contact displacement sensor (P/N: 293311)
Advanced wafer alignment unit
Dual moire scales (X and Y)
High rigidity Z stage
Color LCD control panel with touch panel switches (P/N: 248900)
Alarm lamp pole (P/N: 247820)
Nickel plated cold chuck, 8" (P/N: 249015)
ARTS-HS Chiller unit (ACCRETECH Rapid Thermal System High Speed)
Wafer ID recognition option: Type 6 OCR
Needle cleaning option (Block type: 100 mm x 200 mm and brush)
Probe mark inspection option
Multi site parallel probing option (128 DUT)
GP-IB Interface option: Standard ACCRETECH command
Light VEGA network management option for product recipe management (Ethernet interface included)
Compliance S2-93
Smart PMI Option
Remote terminal option: Full remote control
System level change log option
Automatic PC changer
2011 vintage.
ACCRETECH / TSK UF 2000 is a prober specifically designed for testing and characterizing various materials and semiconductor-based products. It is an ultra-high-precision testing and measuring equipment that is capable of capturing extreme sub-micron-level threads with speed and accuracy. It has a fully automated testing environment which includes a variety of unique tools such as steppers, long-stroke linear profiling, and a high-resolution contact-style profilometer to enable dynamic exercising of samples. TSK UF 2000 prober has a patented automated tab load system which performs inline or multiple sample and loading changes quickly and accurately. Additionally, it has a dual color vision unit which is used for output alignment and zero-point calibration which allows for more accurate and faster testing. The prober also features impact-resistant automation, dust-proof housing, and a sealed particle isolator. The sealed particle isolator prevents contaminants from entering into the testing environment and affecting the results. ACCRETECH UF2000 prober is designed to be operated with minimal operator intervention. It has an automated wafer loading machine, an optional wafer mapping tool and optional test time minimum functionality. The optional wafer mapping asset allows the user to map whole wafers with a single command from a PC or tablet. The optional test time minimum functionality allows users to reduce testing times by specifying the minimum test time for each sample. UF 2000 prober offers a variety of measuring capabilities, including fine pitch probing, advanced wafer routing, 3D surface profiling, die model measuring, and 4roof scanning. It also has the capability to interface with devices such as strobe lights, temperature controllers, and other measuring instruments. It is constructed of a rugged aluminum and steel frame which helps ensure that the model is durable and reliable. ACCRETECH UF 2000 prober is ideal for testing and characterizing vision systems, automotive components, semiconductor parts, and other materials. Its advanced automation and accuracy make it an essential tool for examining and predicting part performance in a variety of industries. It is a highly reliable equipment which allows users to accurately and quickly capture fine details to analyze the performance of their samples.
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