Used ACCRETECH / TSK UF 2000 #9277671 for sale

ACCRETECH / TSK UF 2000
Manufacturer
ACCRETECH / TSK
Model
UF 2000
ID: 9277671
Prober.
ACCRETECH / TSK UF 2000 is a prober used for automated probing and testing of Integrated Circuits (ICs). It is suitable for probing small- and medium-scale ICs, and it boasts several high-performance features that make it an ideal choice for production testing. Its main components include a high-resolution Motorized Stage, a High-throughput Probe Card, a Probing Software Equipment, and a fully automated probing solution. The motorized stage enables precise positioning of the probe cards, while the high-throughput probe card supports multi-site probing and testing. TSK UF 2000 also features a highly intuitive prober software system. This comprehensive unit includes all of the features needed to control the entire probe card, including the configuration of the software, and the performance of complex probe processes. Furthermore, the software is expandable and can accommodate incoming requests from a variety of sources, including incoming test procedures and test automation rules. In addition to its high-performance motorized stage and prober software, ACCRETECH UF2000 also offers a completely automated probing solution. This solution is designed to support all of the test needs of the ICs being tested, and it allows for relatively rapid and reliable testing of ICs. This machine includes an automation module that provides real-time information regarding the testing results of the ICs, and it is also capable of executing multiple test scripts simultaneously. Furthermore, the automation solution also includes a fully integrated Report Window, which allows for the real-time analysis of the test results for all of the ICs that are being tested. Overall, ACCRETECH / TSK UF2000 is an excellent choice for automated probing and testing of ICs. Its ability to quickly and accurately test medium and large scale ICs, its intuitive software, and its completely automated solution make it a great choice for production testing of ICs.
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