Used ACCRETECH / TSK UF 2000 #9399175 for sale

ACCRETECH / TSK UF 2000 is a prober that is typically used to analyze electrical and physical semiconductor wafer characteristics. It is capable of probing wafers up to 200mm in diameter with a high degree of accuracy and repeatability. The equipment can also be used to measure parametric, on-wafer, and probe card performance. In order to fully understand how TSK UF 2000 works, it is important to familiarize oneself with the system's components. The main components are an XY linear stage, a motorized Z-stage, a vision unit with a CCD camera for alignment, a prober arm for alignment, a prober head for probing, and a prober interface which can be controlled by a host PC via a serial port. ACCRETECH UF2000 machine is designed for active probing and can automatically move to the desired position and make contact. The tool also allows for manual probing & alignment. The motorized Z-stage can be used to control the gap between the device surface and the probe, thereby maintaining uniform contact. The vision asset with CCD camera is used to detect the device and wafer surface, while the prober head is used to inspect test contacts on the device and to collect data. The prober head can either be manually moved or operated automatically under the control of the host PC. Additionally, a prober interface board is used to connect the prober head to the host PC. ACCRETECH / TSK UF2000 model allows for direct probing of contact points with active parameter measurement, as well as probe card testing and contact resistance measurements. Additionally, the equipment is equipped with a variety of software tools such as Test Ace and DC/AC Test Pro. These can be utilized to program tests and measure parameters such as voltage, current, power, and resistance. Overall, ACCRETECH UF 2000 is a powerful and versatile prober that can be used for various testing operations for semiconductor devices. The system is equipped with many features such as easy alignment, motorized Z-stage, active probing, and parameter measurement, and is capable of efficiently performing reliable testing operations.