Used ACCRETECH / TSK UF 200A/AL #293642597 for sale

ACCRETECH / TSK UF 200A/AL is a prober used to aid in the assessment of semiconductor circuits. It is specifically used to make contact with probe pads on wafers and other substrates. Its design incorporates a motorized XY stage for specimen positioning, high-precision optical microscope, high resolution optical encoder, and a probing interface. The XY stage consists of two high-precision linear axes, the X and Y, to accurately adjust the position of the probe relative to the device under test. The optical microscope is used to ensure that the probing points are properly aligned and make contact with the probe pads. The microscope also provides a zoom feature to move the probe for repeating probing operations. The optical encoder is used to provide high resolution positional feedback for the probe tip movement, ensuring accuracy during the probing process. TSK UF200A/AL is equipped with a probing interface that includes a chuck, tip, and wafer clip. The chuck supports a probe tip, while the wafer clip holds the wafer firmly in place. The chuck and clip can be electrically adjusted to ensure accurate positioning of the probe tip. ACCRETECH UF 200AAL provides a wide range of probing ability, from single point to multi-point probing. It also has a built-in memory for storing between multiple probing processes. ACCRETECH UF200A/AL is designed for commercial-grade accuracy and reliability. It is capable of withstanding harsh environmental conditions, such as high temperatures and a range of chemicals. Additionally, the design ensures that the probing process is vibration-free and minimizes the risk of probe contact damage. Overall, TSK UF 200A/AL is a versatile prober designed to accurately measure, assess and monitor semiconductor circuits. Its range of features makes it an ideal choice for applications in the electronics and motoring industry. Its high resolution positioning, accuracy and reliability make ACCRETECH UF 200 A/AL the perfect solution for measuring and testing the integrity of semiconductor devices.