Used ACCRETECH / TSK UF 200A/AL #293642601 for sale

ACCRETECH / TSK UF 200A/AL is a prober used to test the electrical characteristics of semiconductor devices. It consists of a probe head, drive mechanism, and various sensing systems used to make contact with the device under test (DUT). The probe head contains a set of pins, which can be configured in a variety of sizes to make contact with the DUT's contact pads. The drive mechanism is usually a stepper motor with a closed-loop feedback system controlling the actions of the pins. On the physical layer, the prober also offers excellent repeatability and accuracy due to its high sensitivity and precise alignment of pins. TSK UF200A/AL prober is capable of collecting highly reliable data for a wide range of semiconductor devices. It has a wide range of contact force settings, which allows precise contact gaps to be maintained during testing even in the presence of vibration and other external forces that often occur during high-reliability test applications. Additionally, it can support a variety of contact materials, ranging from gold to BeCu, and includes a non-contact mode that helps prevent damage to the device during testing. ACCRETECH UF 200AAL prober also includes a range of integrated systems that help ensure accuracy and safety during operation. For example, its far-field optical systems offer precise alignment with the DUT's contact pads, while its contactless capacitive sensing system ensures accurate contact measurements. The prober also comes with a range of safety features, such as a multiple contact lock to prevent accidental contact with the DUT, as well as emergency stop capabilities and an emergency power shut-off. The prober also offers a range of control and software capabilities, including support for a range of computer languages and built-in operating systems, as well as integration with other prober control systems. This allows users to access their data in a variety of formats and to retrieve various information in real time, helping to ensure accurate and robust testing. Overall, UF 200A / AL is an excellent prober system suitable for demanding test applications and a highly reliable source of data for semiconductor device testing. It supports a wide range of test conditions, contact materials, and systems designed to ensure accurate measurements, while its integrated systems and software capabilities make it an ideal choice for research and industrial applications.