Used ACCRETECH / TSK UF 200A/AL #293642609 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200A/AL
ID: 293642609
Vintage: 2006
Prober 2006 vintage.
ACCRETECH / TSK UF 200A/AL is a prober device, typically used in the production of semiconductor devices like transistors, diodes, and other components in the electronics industry. It is a fully automated system with both probing and testing capabilities, in order to make sure that the components being produced meet the specifications that they were designed to meet. It includes a vacuum chuck and a series of four stages, which make up the overall prober system. The four stages are wafer preparatory, the actual prober stage for testing, the optional visual automated inspect stage, and the optional end process stage. The wafer preparatory stage prepares the wafer for testing. This includes preparing it for the actual test process, cleaning it, and also any other steps necessary for the specific type of semiconductor that is to be tested. It is usually an automated process that is programmable, depending on the type of device that is to be tested. The actual prober stage is where the actual testing of the wafer is conducted. This stage uses one or more probes with a series of test points that are set up according to the needs of the project. This is done to assess the functionality and functionality of the individual components being tested, as well as the overall functionality of the wafer. TSK UF200A/AL allows for testing of various aspects of the components, including voltage, current, noise, and power dissipation. The optional visual automated inspect stage is used to check the finished product for any visual imperfections. It is an automated process which compares the design of the component to the finished product, and if any discrepancies exist, it will signal out the discrepancies for further inspection and repair if necessary. Finally, an optional End Process Stage is available on ACCRETECH UF 200AAL that is used to test the finished products. This can include testing for isolation, power leakage, and current leakage. In addition, any tests specific to the components being produced can be added. All of these can be programmed into the system to ensure accurate and reliable results. Overall, ACCRETECH / TSK UF 200A-AL is a highly efficient and reliable prober device, which is capable of accurately testing and validating a wide range of semiconductor components. It is highly adjustable and can be programmed to custom specifications, in order to ensure the most accurate results are obtained for the components that it is used for.
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