Used ACCRETECH / TSK UF 200A/AL #9395547 for sale

ACCRETECH / TSK UF 200A/AL is a prober designed for testing a variety of semiconductor substrates. It offers advanced features for precise and reliable measurements of transistor, capacitor and gate structures. TSK UF200A/AL is equipped with a high performance prober head, laser-scribed aluminum probe cards, and open-loop gap control. These components, together with high-performance optics and a powerful motor, provide a great combination for accurate probing of devices up to 5μm with minimal alignment problems. Additionally, with the built-in force control, it can handle a wide range of loading forces, ranging from 0.1 to 10g. ACCRETECH UF 200AAL also offers optional integrated wafer characterization systems, allowing users to quickly analyze signal performance with minimal setup time and without complicated external instrument connections. This provides an improved test environment for measuring outputs and device characteristics such as programmable logic and memory devices. For added convenience, UF 200 A / AL features an integrated XY table. This allows users to move and position the wafer under the probe head with ease, providing a superior alignment and placement of the probes across the wafer. This ensures accurate and repeatable test results for each device. In order to ensure safety and device protection, ACCRETECH UF 200 A / AL is equipped with high-voltage protection circuits. This prevents damage to the probe cards and wafers due to overvoltage. Furthermore, the Intelligent Status Monitor system allows users to monitor the on-prober status and parameters, providing a reliable tool for diagnosing problems and ensuring optimal operation. Additionally, UF 200A-AL also comes with an easy-to-use software package that allows users to create test programs and align probes to the wafer. This creates a user-friendly and efficient test setup, ensuring quick and accurate results. Overall, ACCRETECH / TSK UF 200 A/AL provides a powerful and reliable solution for semiconductor wafer probing and testing. With its advanced features, such as high performance prober head, laser-scribed aluminum probe cards, Open-loop Gap Control, Force Control, integrated XY table, and high-voltage protection circuits, it facilitates an improved testing environment for difficult testing tasks. This combined with the integrated characterization systems and user-friendly software package makes UF 200A / AL an ideal choice for testing and probing an array of semiconductor substrates.