Used ACCRETECH / TSK UF 200A #293679659 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200A
ID: 293679659
Vintage: 2003
Prober 2003 vintage.
ACCRETECH / TSK UF 200A is a prober designed for use in semiconductor process development and failure analysis. This prober is a stand-alone system with a positioning accuracy of 1µm, making it ideal for probing fine-pitch devices for analysis as well as for preparing devices for production. TSK UF200A prober features a highly reliable X-Y motion stage and an air-bearing based elevator allowing it to accurately access probe points of any size and pitch. Its advanced probing technologies includes a 3-axis micro-meter control substrate stage, supporting multi-level I/O card architectures, with up to 12 different distance offerings. The prober has an auto-calibration and on-the-fly retracing features allowing it to rapidly test various sizes of substrates without compromising its accuracy. It also includes a high precision six-axis vision system with a 1.3 MP camera and image capture capabilities that allow it to rapidly and accurately sample substrates from 0.3 mil or 7.5 µm up to 6". In addition to its advanced capabilities, ACCRETECH UF 200 A also has a high-speed 10k 40-bit buffer memory for handling large data sets. Its automated software can detect and reject any outliers, as well as collect and store data over a long period of time. ACCRETECH / TSK UF200A also provides a large selection of column types, from single-tip probes to die-to-die or die-to-circuit testers. It provides both manual and automatic calibration of the probe position, making it easy to set up and quickly test different kinds of devices. ACCRETECH UF200A is an ideal choice for testing fine-pitch and complex chips that require quick turnaround times. It is well suited for high-volume testing and can handle high-levels of throughput and flexibility. Additionally, this prober is provided with Windows compatible software that's easy to learn and operate, allowing users to quickly gather needed data without compromising accuracy.
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