Used ACCRETECH / TSK UF 200A #9171744 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200A
ID: 9171744
Vintage: 2003
Prober RS232: Yes GP-IB: Yes Ambient / Hot chuck: 30 C ~ 150 C Internal printer: Yes External printer: No Dual cassette: No Single cassette: Yes Chuck type: Gold 2003 vintage.
ACCRETECH / TSK UF 200A is a fully-automated wafer prober for use in semiconductor materials research and quality control. It is designed to quickly, accurately, and reliably test the electrical and physical properties of such materials as silicon, gallium arsenide and diamond. The prober is equipped with a high-speed and precision Motorized X-Y Axis control equipment, capable of handling up to 200 mm wafers, including 4" and 6" wafers. The system is designed to provide a high level of accuracy and stability with low power consumption and rapid response time. TSK UF200A features an advanced optical alignment unit that can provide high detection accuracy, even with angled test positions. An integrated vision machine is also included to provide additional test capabilities and data accuracy. This tool is used to measure the surface roughness of the sample, as well as the edge profile and surface defects. The proprietary software included with ACCRETECH UF 200 A can also be used for simple parameter programming, such as for setting test parameters and objectives. ACCRETECH / TSK UF 200 A is equipped with a high-resolution laser displacement sensor for shape measurement and can be used for a wide range of tests such as junction depth profile, etching depth, notch measurement, doping depth, depth of leading edge, and many other RAM related tests. The onboard software also offers various options to control the displacement and scan directions, to ensure that the measurement sizes and positions are accurately measured. The automated software also provides functions such as statistical analysis, reporting, and visualization. UF200A also features a highly sensitive and accurate voltage/current source and probe to accurately measure the capacitance, resistance, and transistor current characteristics of the sample. It is also equipped with a contact force actuator for precise probe-to-sample contact. As a result, the asset is capable of performing multiple tests continuously and accurately at extremely high speeds. In addition, TSK UF 200A provides a robust data collection and analysis model which is capable of producing detailed reports with detailed electrical and physical performance data. It can also generate test data in various formats, including 3D curves, diagrams, charts, or any other graphical or tabular data that can be used for analysis. The secure, cloud-based data management equipment ensures that all test data is securely stored and accessible at all times.
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