Used ACCRETECH / TSK UF 200A #9246672 for sale

ACCRETECH / TSK UF 200A
Manufacturer
ACCRETECH / TSK
Model
UF 200A
ID: 9246672
Vintage: 2004
Prober Gold chuck, 8" No OCR E2 Camera Probe Clean pad Loader Temperature range: Ambient 150°C No manipulator No docking kit / Head plate 2004 vintage.
ACCRETECH / TSK UF 200A is a prober used for testing the electrical characteristics of semiconductor devices. This prober offers a full range of capabilities, including test setup and testing of all types of semiconductor devices, ranging from conventional silicon-based components to microelectromechanical systems (MEMS). TSK UF200A utilizes four-probe Kelvin measurement technique and optimized noncontact power probing for accurate testing. The prober can detect multiple types of parameters including current, voltage, transmission loss, power dissipation, and more. It is able to accurately measure insulation resistance, leakage current, and breakdown voltage without heating the device. The prober is equipped with a high-capacity power probing system, allowing the user to measure powers ranging from milliwatts to up to 100 watts or more depending on the prober model. The system is complemented by a high-speed probing speed of up to 1 MHz. In terms of control, ACCRETECH UF 200 A is powered by dedicated software and hardware platforms, allowing the user to monitor and control the test results while preventing device damage. The prober supports user-developed routines and scripts, providing the user with greater flexibility in data analysis. The prober is supported by an extensive library of test boards, which offer a range of sizes and configurations. The prober is also well suited for ATE testing, with the ability to handle a wide variety of DUT types and environments. UF200A is the ideal prober for testing the electrical characteristics of semiconductor devices. With its four-probe Kelvin measurement technique, high-seconds probing speed, and dedicated software and hardware platforms, the prober provides a comprehensive solution for testing a wide range of parameters.
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