Used ACCRETECH / TSK UF 200A #9270771 for sale

ACCRETECH / TSK UF 200A is a prober used for wafer testing and production. It has a wafer size range from one inch to eight inch. The features and capabilities of this prober make it one of the most versatile tools for production testing. This advanced prober is equipped with a precision tight-locking chuck system and a high-sensitivity alignment video microscope. This feature allows close control of the die-to-die alignment. The tool is also equipped with software that enables auto-calibration and creates an auto-align sequence which is both efficient and accurate. The prober has a non-contact thin-film wafer catcher, which aids in the handling of film-coated wafers, and helps prevent wafer damage. Additionally, the prober has an wafer deceleration buffer, which reduces the shock caused by sudden deceleration after a test. TSK UF200A is equipped with a high-integrity selector arm construction. This feature helps prevent misalignment and reduces the number of mis-triggering operations. The probe tips have been designed to provide efficient and long-lasting electrical connection. The prober's precision chuck-like contact system and sensitive alignment video microscope provides optimal contact stability. This feature helps ensure accuracy and precision, as well as eliminates the potential for contact point damage. ACCRETECH UF 200 A also has a dedicated RAM SIMD vector processor. This vector processor is designed to provide fast, high-speed data acquisition. The prober has an automatic software-controlled, in-chuck alignment. This unique feature helps reduce time spent manually aligning the tool. This advanced prober provides numerous other features and capabilities such as Z-axis scanning, programmable wafer to wafer spacers, large-screen basic-interface LCD display and embedded Windows-type graphical operating system. In addition, the tool has several custom hardware and software options. UF 200A offers unparalleled accuracy and flexibility for high-volume production testing. This prober's advanced features and capabilities optimize test speed, increase yields and reduce cost.