Used ACCRETECH / TSK UF 200A #9274680 for sale
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ID: 9274680
Prober, 8"
COGNEX 8200
Hot nickel chuck
MHF-300L Hinge manipulator
2003 vintage.
ACCRETECH / TSK UF 200A is a fully-automated wafer prober that offers precise wafer probing, prober calibration, and measurement capabilities. It is designed to provide accurate and repeatable measurements on a variety of substrates, including GaAs and InP substrates. The prober is capable of probing up to 200 mm wafers, and can quickly move substrates up to 200 mm with its high-speed stepping motor. The prober includes a vacuum chuck and Hi-6 precision stage, which offer a flexible and repeatable substrate positioning system. It also features an advanced die-picking and die-placement system, which can accurately place dies up to 10 micrometers in height. The prober is equipped with powerful backside camera, which can capture images of the die location and size. TSK UF200A is designed with a combination of high-precision motors and advanced sensors, which provide an accurate process during prober operations. The prober is designed with a visual reporting system, which can provide an automated readout of probe points, alignment results, and die-to-die placement for up to 32 dies. The prober also includes various digital and analog I/O ports, as well as a high-speed Ethernet connectivity, which provide monitoring and remote access capabilities. The prober also has programmable alarm limits, which allows users to immediately detect if the measurement results have out of specification parameters. ACCRETECH UF 200 A is also equipped with various integrated metrology systems, and can measure wafers according to various conventional standards. The prober is capable of probing with a 24-point probe card and measuring the visual alignment and surface roughness at each point. It also has the capability to measure both form and surface roughness characteristics on multiple substrates in one operation. Additionally, the prober has the ability to measure fast and accurately positioning measurements with the Hi-7 high-precision stage and ±50 μm XYZ fine alignment. With its advanced calibration functions, the prober is able to maintain a high degree of accuracy throughout its lifecycle. UF 200A is a leading wafer prober, offering a wide range of features and capabilities for accurate and repeatable measurements on substrates up to 200 mm. With its combination of high-precision motors, advanced sensors, and integrated metrology systems, the prober is able to provide precise measurement results and maintain a high degree of accuracy over its entire lifecycle.
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