Used ACCRETECH / TSK UF 200A #9283853 for sale

ACCRETECH / TSK UF 200A is a prober developed by the joint venture between TSK and Tokyo Seimitsu Kikai Co. Ltd. This prober has been designed to provide accurate and repeatable measurements of wafer-level semiconductor device surfaces. The UF series of probers features an auto focus capability and is designed to make a wide variety of electrical, mechanical and optical characterizations on substrates. Physically, TSK UF200A consists of a movable table and arm assembly, a manipulator such as an articulated arm, a visual inspection camera and a probe holder. The table and arm assembly can be adjusted to align the probes, which are mounted on the arm, to the probe position required by the substrate. A manual or automatic mechanism can also be used to position probes. The articulated arm is used to orient the probes towards the substrate and adjust their position as needed. The articulated arm can also be adjusted to ensure that the probes are in direct contact with the substrate. ACCRETECH UF 200 A is capable of making a wide variety of electrical measurements such as current, voltage, capacitance, resistance, and leakage current. UF200A also provides integrated testing for four different probe types such as single contact, dual contact, four contact and multi-contact probes. The integrated testing capabilities allow for the simultaneous measurement of four different temperatures from the same substrate. In terms of its visual inspection capabilities, ACCRETECH / TSK UF 200 A is equipped with a high-resolution CCD camera and an optional field monitor for viewing both the outside and inside of the substrate. This feature allows for the easy troubleshooting of material defects and structural weakness in the device. UF 200 A also features a wide variety of measurement ports, allowing for the connection of numerous external devices such as temperature controllers and external amplifiers. In this way, ACCRETECH UF200A can be easily integrated with an existing automated wafer testing equipment. Furthermore, ACCRETECH UF 200A is equipped with a sophisticated electronic control system that stores probing sequences, speed settings and pins, as well as other necessary information. This unit allows for improved viewing, interpretation and analysis of data. In conclusion, TSK UF 200A is an advanced prober designed to provide accurate and repeatable measurements of wafer-level semiconductor device surfaces. Its combination of integrated testing capabilities, visual inspection features and comprehensive electronic control machine makes it ideal for integration with automated wafer testing systems.