Used ACCRETECH / TSK UF 200A #9283867 for sale
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ACCRETECH / TSK UF 200A is an advanced general-purpose prober used to probe and test various semiconductor devices. It is designed to provide superior accuracy, sensitivity, repeatability and long-term stability for probing of small devices up to 200-micron diameter. TSK UF200A provides precise handling for accurate results. It is equipped with a robust two-axis positioner and a base-mounted microscope that ensures repeatable measurements to 0.1 μm accuracy over a range of 0.2 - 200 μm. It offers high speed, high resolution and high accuracy in all three axes, providing reliable test results. ACCRETECH UF 200 A has various features that make it suitable for semiconductor probing and testing applications. It is equipped with a 200-micron needle probe tip, an Auto-leakage Detector and a non-destructive shadowgraph. The Auto-leakage Detector accurately measures source and drain current with sub-microamp resolution, while the shadowgraph allows direct device evaluation even on chips with small contact points. UF200A is easy to use, with a user-friendly interface, menu-driven operation and individual settings for each step. It allows for rapid parameter adjustments during probing, allowing for higher throughput. Furthermore, it is compact, with a small footprint that makes it easy to fit into most workstations. The tool is also incredibly versatile, offering multiple probing applications. Its two-axis positioner allows for a variety of applications, from wafer probing to device testing, and its standard and optional accessories allow for advanced probing, probing to high aspect ratios, and even active probing with the use of an anemometer. Overall, TSK UF 200A is an advanced prober offering superior accuracy, repeatability, and stability for probing and testing of semiconductor devices. It offers a compact design and is suitable for a variety of probing applications. Finally, it is also user-friendly, allowing users to quickly adjust parameters on the fly and achieve higher throughput.
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