Used ACCRETECH / TSK UF 200A #9395544 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200A
ID: 9395544
Wafer Size: 8"
Vintage: 2003
Prober, 8" 2003 vintage.
ACCRETECH / TSK UF 200A is a prober designed to quickly and accurately measure the electrical characteristics of various types of semiconductor components. This prober has an ergonomic design, with an intuitive and easy-to-use interface. TSK UF200A is well suited for both automotive and industrial applications, allowing users to accurately measure the electrical parameters of a wide array of components including capacitors, hybrids, linear arrays, and non-linear components. ACCRETECH UF 200 A prober features a dynamic-range measurement equipment, with an adjustable frequency band, to provide an improved performance in both DC and AC measurements. This dynamic range feature ensures that the prober can be used for various components with different voltage values. TSK UF 200A also offers superb resolution, with a maximum error rate of 0.1 percent. This provides users with an extremely accurate way of measuring electrical characteristics. UF 200A utilizes a maskless, optical microscope to allow users to visually inspect ICs during testing. This feature makes it easier to identify defective ICs and to diagnose problems quickly. This scope also can perform automatic alignment to ensure flawless testing results. ACCRETECH UF 200A also offers die-level parametric measurements to empirically measure the electrical characteristics of ICs and other components. This feature measures voltage, current, and on-resistance as well as temperature sensitivity, conduction delay time, and transient characteristics. In addition, UF 200 A is equipped with a type of exception handling system which increases the efficiency of the overall testing process. This unit can automatically detect faulty ICs and STOP testing when the boundary conditions are exceeded, allowing users to quickly identify defects. Overall, ACCRETECH / TSK UF200A prober is an efficient and reliable testing machine for a wide range of semiconductor components. Its intuitive and easy-to-use interface allow for quick and accurate measurements of electrical characteristics. The addition of the maskless, optical microscope, die-level parametric measurements, and exception handling tool demonstrate that UF200A is an excellent tool for both automotive and industrial applications.
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