Used ACCRETECH / TSK UF 200AL #293591456 for sale

ACCRETECH / TSK UF 200AL is a prober designed to perform wafer-level testing of integrated circuits. It is equipped with a two-dimensional measurement head, enabling high-speed, self-calibrating wafer level testing. The prober offers superior accuracy and resolution in both X-Y and theta positions with its dedicated recognition equipment, servo system and the positional accuracy. TSK UF200AL prober is equipped with a stepper motor-focused positioning unit which allows for movement and alignment of a wafer for testing. The motor provides an extremely low friction environment allowing for a high speed wafer movement up to 6 inches per second. The position accuracy of the prober is 0.5 microns, enabling high precision wafer probing and testing. The prober includes a built-in vacuum machine that supports a variety of acceleration methods, such as gravity, vacuum, and spring force. These methods help to ensure a stable test platform for accurate testing results. The prober can also be used for chucking or dicing operations, making it suitable for various types of integration strategies during the production process. The prober is equipped with a digital camera to provide an enhanced output by identifying verification points. This digital camera is capable of capturing images in 2D, 3D digital images, and stereoscopic vision. This digital camera is inbuilt with a measurement tool to provide repeatable, non-distorted, higher accuracies in XY and arc-theta position measurements. ACCRETECH UF 200 AL prober also comes with an in-built video processing unit. This unit can analyze and compare video images in real-time, which helps in identifying faults and defects on the wafer. The asset can also support multi-level probing for a variety of applications. In terms of control, UF 200AL prober offers several options. It includes a flexible programmable controller, as well as a dedicated open desktop application. This application allows for offline programming, operator training, and the setting of parameters such as speed, positional accuracy, and pressure compensation. All of these features combine to make UF200AL an ideal choice for wafer-level testing and probing needs. Its position accuracy and versatility make it a reliable and accurate choice for production and quality control. With its ability to take advantage of advanced digital imaging technology, the prober can provide proof of accuracy and repeatability, yielding reliable and repeatable test results.