Used ACCRETECH / TSK UF 200AL #293626666 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200AL
ID: 293626666
Vintage: 2000
Prober 2000 vintage.
ACCRETECH / TSK UF 200AL is a semiconductor prober for analyzing microelectronic devices. It is used in the testing and development of new products and devices. The prober has an intuitive user interface, allowing engineers to quickly ramp up on the equipment operation. TSK UF200AL uses a high-accuracy XYZ stage with a high speed of three metres per second. It also features a high-precision adjustable arm and a 600mm reach. The prober can accurately measure and analyze microelectronic devices with length ranging from two microns to two millimetres. The prober has a high-definition optical sensor, fully featured electronics and software for analysis. It also includes AFC (adaptive focus control) technology, automated probing and operation without an external PC operating system. The automatic wafer-level testing systemfeatures automated wafer loading, unloading, metrology scanning and a puse-and-scan operation. This feature allows for a quick turnaround time on samples. The prober also includes a wide range of interface options for different environments and provides a safe and reliable working environment for test engineers. ACCRETECH UF 200 AL has a vacuum chuck with a temperature range between -20°C and 200°C. This is useful for minimizing thermal effects which could affect device characteristics. The high-accuracy mechanical stages and laser positioning systems of the prober achieve high positioning accuracy within the range of ±1μm. UF 200 AL features a compact design with a small footprint and high payload capacity, allowing engineers to work in a laboratory environment with minimal space. The unit can be integrated with a variety of tools, such as microscopes, cameras, lasers, spectrometers, optical detector and dispersive spectrometer. The machine features a modular, open-architecture design, allowing for easy and quick upgrading and updating. In conclusion, UF200AL is a versatile and powerful semiconductor prober for testing and analysis of microelectronic devices. It offers high accuracy and speed for a range of samples. The prober also comes with a range of interface options and can be integrated with different tools for additional functionality.
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