Used ACCRETECH / TSK UF 200AL #9190401 for sale
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ACCRETECH / TSK UF 200AL is a prober equipment used for wafer and other substrate testing, primarily in the semiconductor industry. It is a vertical type prober that offers a fully automated, cost-effective, and reliable solution for device testing. TSK UF200AL features a robust and high-performance design, and its high throughput capability makes it ideal for high-volume production. ACCRETECH UF 200 AL is a fully motorized prober that has a floor space of just 540mm x 545mm. It also has a maximum working area of 200mm x 200mm. This allows the prober to be used on a wide range of wafer sizes, including 6 to8-inch wafers. It is also capable of testing thin-film transistors (TFTs) and packages. ACCRETECH / TSK UF 200 AL can be configured with a variety of different substrate holders, and can also be connected to other accessories in order to expand its functionality. For example, it can be connected to an Automated Chemical Analysis (ACA) system for chemical analysis of the wafers. ACCRETECH UF 200AL has a maximum lifting speed of 30mm/s and it is controlled by a digital servo motor and a dedicated servo amplifier for low noise and stable operation. The prober also features a 12-segment Z-axis, allowing for the accurate alignment of probes and substrates. UF 200 AL also has an EFEM unit, which is a programmable feature, allowing the user to control the entire prober from a remote terminal. UF 200AL achieves a highly accurate and repeatable probe contact force measurement with its advanced force-feedback machine. The tool is capable of measuring a maximum force of 5g, and it can provide a force resolution accuracy up to 0.01g. The asset also features a groove selection mechanism and a Z-axis movement resolution of 0.01μm, allowing for a more precise and controlled probing process. ACCRETECH / TSK UF200AL is a reliable, reliable and efficient prober model that offers a viable choice for high volume wafer and package testing by semiconductor manufacturers. Its features include a robust design, a high-performance motorized prober, a force-feedback equipment, and a reliable and cost-effective automated solution.
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