Used ACCRETECH / TSK UF 200AL #9283903 for sale

ACCRETECH / TSK UF 200AL Prober is a needle prober designed for wafer probing and is used for electrical testing in semiconductor manufacturing. It has a compact design that offers high levels of repeatability and accuracy for wafers up to 200mm in diameter. The prober is designed for high throughput, with a cycle time of only 8.5 seconds per chuck movement, and a throughput of up to 720 wafers per hour. The prober is equipped with an advanced probe card, which offers accuracy of +/- 0.5 microns and repeatability of +/- 0.1 microns. It also includes a motorized probe card loader and unloader, with handling of either tape or tray wafers. The prober has an adjustable chuck alignment accuracy of +/- 3 microns in both axes, excellent flatness, and a very low tip life variation. The prober comes with an easy-to-use programmable interface, allowing users to configure the prober according to their needs. The prober also includes a set of dedicated software packages, allowing users to easily set up and optimize test parameters. The prober is also compatible with existing test platforms, such as Accra and TC2, allowing users to easily connect the prober to controlling systems for setup and operability. In addition to its electrical testing capabilities, TSK UF200AL prober also offers temperature and humidity sensing, as well as AC and DC power measurement and accuracy of +/- 0.1% during measurement. The prober has integrated protection features for wafer and mechanical protection, such as jig attachment, to ensure maximum safety of the devices and measuring equipment. Overall, ACCRETECH UF 200 AL Prober is a high-performance, reliable wafer-probing solution for efficient electrical testing and data collection. It provides outstanding accuracy, repeatability and throughput capabilities, enabling efficient testing and data collection of larger wafers, up to 200mm in diameter. The integrated protection features also ensure maximum safety and accuracy of test parameters.