Used ACCRETECH / TSK UF 200D #9118412 for sale

ACCRETECH / TSK UF 200D is a state-of-the-art prober used for wafer test and metrology applications. It is designed for probing, mapping, analysis and inspection of both silicon and non-silicon wafers. TSK UF 200D is a fully automated probing system that can accurately measure the electrical characteristics of devices on independently mapped areas of the wafer surface. It features a high throughput, highly reliable test process, with the ability to measure up to seven different electrical parameters in a single wafer map. ACCRETECH UF 200D offers a variety of options in terms of probing capabilities, providing superior test precision and flexibility. It is equipped with a dual-sensor configuration, allowing for wafer area of up to 7 inches in size and a two-level sensor head that can be moved over the wafer surface at a maximum Z axis of 200µm. This allows for probing various sizes and pitches, as well as a variety of test structures and different types of structures such as soft bumps and high aspect ratio features. The prober also includes a wafer thickness monitor for measuring wafer thicknesses in the range of 0.3 to 1.2mm. UF 200D also offers a variety of testing options such as electrical IV, C-V, or Leakage current testing. It features an accelerator box that can reduce the environmental influence on electrical characteristics, bringing a high stability in test results. The wafer mapping process is done through a proprietary software system that controls the movement of the prober head and ensures quality mapping and testing performance. The system is also equipped with a wafer chuck that allows for rapid and accurate controlled sample placement. ACCRETECH / TSK UF 200D is designed for reliable and repeatable performance. It is equipped with hardware and software features that provide self-diagnostic and maintenance features, which minimizes downtime and increases process throughput. It is also certified to ISO9000 and ISO9001 standards for quality assurance. Overall, TSK UF 200D prober provides an accurate, efficient and reliable solution for running quality test processes and providing quality results in the shortest time. It is versatile enough to handle a variety of probing applications and offers maximum flexibility for wafer measurement and testing requirements.