Used ACCRETECH / TSK UF 200R #293591573 for sale

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Manufacturer
ACCRETECH / TSK
Model
UF 200R
ID: 293591573
Vintage: 2019
Prober 2019 vintage.
ACCRETECH / TSK UF 200R is a high-performance wafer prober that has been developed to meet the demands of modern semiconductor device production and advanced research. TSK UF200R prober is an automated, multi-functional equipment that can be used to inspect and test a wide range of semiconductor devices, ranging from ultra-sensitive MEMS devices to complex advanced wafer assemblies. ACCRETECH UF 200 R features an advanced five-axis mechanism, providing superior accuracy and high-speed probing over its entire work area. This system allows for high-speed probing of any test structure without having to adjust the probe alignment manually. With the optional optical metrology unit, ACCRETECH / TSK UF 200 R can accurately measure distances up to eight microns. UF 200R's advanced optical metrology machine consists of a customizable measurement area, which is measured with an ultra-precise non-contact pixel-drive laser tool. ACCRETECH UF200R also features an integrated auto-zoom zoom asset, which automatically zooms in on the area of interest when measuring. The model also offers advanced quantitative micro-inspection capabilities, allowing for the capture of sharp images at magnifications of up to 500 times. UF 200 R is versatile and capable of accommodating a wide range of probe configurations. It can be used to test planar and 3D devices with a choice of probe sets, including cantilever probes, parallel contact probes, or wafer-level bump-probes. This ensures that the optimal probing solution for any test configuration is available. It also supports a wide range of wafer sizes and substrates, including GaAs, SiC, and InP. In addition, TSK UF 200R offers an integrated machine vision equipment, with an integrated CCD camera, allowing for fully automated visual inspection of the test structures. It also supports a range of imaging options, including bright/dark field measurements, contrast control and imaging with polarization, as well as full white-light interferometry. ACCRETECH UF 200R is easily controlled and automated through open interfaces, including multiple communication protocols, enabling users to easily integrate the system into their existing production lines. Finally, UF200R is built with high-quality components and is backed by a comprehensive technical support team, ensuring reliable operation and excellent performance. Designed to meet even the most demanding requirements, TSK UF 200 R is one of the top unit solutions on the market for probing and testing of semiconductor devices.
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