Used ACCRETECH / TSK UF 200R #293663153 for sale

ACCRETECH / TSK UF 200R is a prober designed for precision measurements of wafer parameters. It is a fully automated system that provides high accuracy, repeatability and stability. TSK UF200R features a 5-Axis configuration for precise measurements of both flat surfaces and round surfaces. The prober is designed for a wide variety of processes such as lithography, oxidation, diffusion, laser machining, CMP, heat treatments, and others. ACCRETECH UF 200 R is equipped with a highly sensitive profile monitor which is capable of detecting small differences in surface profiles. The profile monitor features both an analog oscilloscope and a digital display to help visualize the data. Additionally, ACCRETECH / TSK UF200R also includes a stylus contact mechanism that can measure the height of bumps or step heights down to 200nm in order to ensure exact surface planarity is maintained. The prober comes with a proprietary software package which is designed to make measurements easy and efficient. The software package includes a graphical user interface for macro programming which can be used to automate complex measurement tasks. Additionally, the software also provides functions for correlating parameters such as magnitude, phase, wave-shape and polarization. Furthermore, three standard sizing circuit boards are also provided to facilitate development, calibration and alignment of the prober. ACCRETECH / TSK UF 200 R is equipped with multi-zone alignment lasers and stage accuracy valves which can ensure precise and accurate alignment for the measurement system. The prober can also be used for a variety of parametric analyses such as component-to-wafer alignment, wafer analysis, circuit analysis, etch depth, thickness profiling, flatness measurement, and more. Additionally, the contact force and the prober's probe head can be adjusted to accommodate different types of systems such as MEMS and optoelectronic processes. Overall, ACCRETECH UF 200R is a precise and accurate prober that is well-suited for a variety of processes. Its highly-sensitive profile monitor and automated software package make it an effective tool for precision measurements. Its wide variety of features and functions allow it to be used for both high-precision and complex measurement tasks.