Used ACCRETECH / TSK UF 200R #9269335 for sale

ACCRETECH / TSK UF 200R is a dedicated-probe scanning electron microscope (SEM) that is designed to provide high-resolution imaging for failure analysis, materials characterization, and process monitoring. Its integrated digital electronics and user-friendly operation make TSK UF200R the ideal choice for many SEM applications. ACCRETECH UF 200 R offers a detection system of an e-beam current of up to 150nA, a 1.7nm source spot resolution, up to 20,000X magnification, and a field of view of up to 10mm. It is also equipped with an aiming beam guide and a digital reticle, which allow users to easily locate regions of interest. It can also image samples up to 200nm thick with an LOD of 20nm. TSK UF 200 R also features a variable-angle tilt-stage that enables a wide range of angle measurements. It includes an integrated measurement system to accurately and quickly record data, and allows users to select specimen thickness, observation mode, draw a form, and switch between various excitation modes—all from the same interface. In addition, UF 200 R comes with a comprehensive imaging and analysis package, which includes an image editor, marker, quality check, spectral analysis, cinematic effect, and color control. It also provides a wide range of analytical tools for conducting X-ray micro-analysis, optical compaction, elemental mapping, image contrast enhancement, and more. ACCRETECH / TSK UF 200 R is capable of performing even the most complex SEM imaging and analysis tasks with ease and efficiency. Its compact design, high-speed scanning, and sophisticated software make it the ideal tool for quality control, failure analysis, materials characterization, and process monitoring.