Used ACCRETECH / TSK UF 200S #150857 for sale

ACCRETECH / TSK UF 200S Prober is an advanced prober system designed specifically for inspecting the performance and production quality of semiconductor devices. This prober can quickly and accurately measure surface flatness, temperature, humidity, deformation, vibrations, strain, and other parameters for various substrates, frames and other related components. TSK UF200S utilizes an innovative and reliable multi-channel scan algorithm that ensures accurate and precise data acquisition and analysis. ACCRETECH UF 200 S is designed with modular components that enable users to customize to their specific requirements. It features a powerful processor with a large memory capacity that enables faster data acquisition and analysis. The scanner is integrated with a CCD camera and an integrated microscope with a zoom lens to provide high-resolution images of the sample under test. Its adjustable microscope stage can move along the x-axis, y-axis and z-axis directions. It enables an extremely wide range of measurements, such as high-resolution images of the sample, angular and linear measurements, surface flatness, area, tilt, and other parameters. TSK UF 200 S also includes a variety of test head modules and a range of measurement accessories. By integrating with these component modules, users can easily create a complete testing system and optimize their testing process. It also offers powerful software packages that provide users with a complete set of functions for hardware, data processing and analysis, reporting and other features. ACCRETECH / TSK UF200S boasts a wide range of features that enable the user to measure various sample properties quickly, accurately and reliably. It offers a large sample area up to 400 square millimeters and precise scanning resolution up to 0.5 nano-meters. It can also measure height variations up to 1 nanometer. Furthermore, its precise positioning accuracy ensures precise placement of the sample on the prober. Moreover, a high speed scanning time of 10 ms allows users to quickly measure a large quantity of samples. All in all, ACCRETECH UF 200S is an advanced prober system with a wide range of features to help accurately measure the performance and production quality of semiconductor devices. It offers a precise and reliable scanning algorithm, modular components and powerful software packages that make testing and analyzing easier and more efficient. UF 200S is an ideal choice for companies looking to maximize the accuracy and efficiency of their testing process.