Used ACCRETECH / TSK UF 200S #9243577 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 200S
ID: 9243577
Prober.
ACCRETECH / TSK UF 200S Prober is a user-friendly device designed for the wafer probing and testing of silicon or other materials in the semiconductor industry. It is a fully automated equipment with multiple application support, including visual and electrical check, measurement, and testing capabilities. TSK UF200S Prober features a robust stage design, with highly precise manual and automated tooling capability. It has a 3-axis system with a large X/Y/Z work area, allowing for accurate die placement and probing. It also supports a wide range of probe cards, making it an ideal solution for a variety of wafer types, shapes, and sizes. The unit also offers a range of auto-leveling and movement capabilities, providing increased accuracy when probing die or device pads. ACCRETECH UF 200 S Prober is capable of achieving nanometer-level accuracy and repeatability. It utilizes a range of high-accuracy probing components, such as touchless probes and sensor probes, as well as blade probes, enabling the device to collect reliable data and measurements at all times. Furthermore, its advanced software control, with programmable command sets, enables the testing of a wide range of devices and components. The machine also includes a suite of powerful tools to help improve test speeds and accuracy. Its oscilloscope feature offers outstanding dynamic resolution, enabling technicians to quickly troubleshoot issues and identify sources of noise. Furthermore, its OptiCheck feature enables the user to measure precisely and quickly the electrical characteristics of transistors, resistors and capacitors, to ensure that they fall within pre-defined limits. TSK UF 200 S Prober also features multiple alarms and monitor indicators, providing the user with a greater range of control during testing. Overall, UF 200 S Prober is a powerful and practical device, designed to provide users with reliable test data, as well as precise and accurate probing of a wide range of components and substrates. Its precise tooling and software control capabilities, integrated with its intuitive user interface, make it an ideal solution for a variety of wafer testing applications.
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