Used ACCRETECH / TSK UF 200S #9270790 for sale

ACCRETECH / TSK UF 200S is an atomic force microscope (AFM) that is used for probing structures of nanoscale materials. TSK UF200S is a high-resolution, low-noise AFM with a large sample size that makes it suitable for applications in semiconductor, biological, and materials researches. The AFM is designed to measure the dimensions of nanoscale features with a high degree of accuracy. ACCRETECH UF 200 S is equipped with a high-speed ZDrive. This feature enables fast sample scanning and improved time resolution. The ZDrive is also used to control the scanning parameters, allowing the user to make fast and accurate measurements. Furthermore, ACCRETECH / TSK UF 200 S has a high probe resolution and low noise structure, enabling the user to accurately measure features of up to a few nanometers in height and width. Another feature of UF 200 S is its high-quality imaging capability. The AFM uses a cantilever probe and has single pixel resolution imaging. This system is capable of producing images of nanostructures with great precision. Furthermore, the AFM also has an integrated thermal chamber that can be used to study the thermal properties of materials by monitoring their temperature profiles. UF200S also has an advanced software suite that provides a wide range of features for operating and analyzing AFM images. This software allows the user to easily measure and analyze topographical features, such as surface roughness, step height and profile, and line widths. Furthermore, the software also provides advanced analysis tools such as Fourier transform, Z-average, and line profile fitting. Finally, ACCRETECH UF200S is well suited for high throughput applications. This is due to its automated scanning workflow, which makes it possible to quickly analyze large numbers of samples. Additionally, the AFM also has various hardware components that enable efficient data acquisition, allowing the user to save time and resources. Overall, TSK UF 200 S is an advanced AFM system designed for measuring nanoscale features. Its high levels of accuracy and resolution make it suitable for research applications in materials, biological, and semiconductor fields. Furthermore, its automated workflow and advanced software make it well suited for high throughput applications.