Used ACCRETECH / TSK UF 200S #9365975 for sale

ACCRETECH / TSK UF 200S is a prober equipment designed for semiconductor wafer testing and probing. The prober combines the hole-through probing technology of the THP series with the non-contact AC impedance technique of the ICP series. This allows for a wide range of testing and probing operations with a high degree of accuracy and reliability. TSK UF200S features an automated vacuum system, providing a controlled pressure range, which is ideal for handling small substrates and preventing contamination. The precision pressure control helps to ensure accurate testing and probing results. The unit is designed to handle wafers up to 8 inches in diameter. ACCRETECH UF 200 S features a high-resolution CCD camera that uses motion and autofocus technology to ensure sharp high-resolution images. This machine is designed to provide precision probing and measurement accuracy. It is also capable of performing a wide variety of electrical tests, such as low-level and high-level circuit tests, as well as resistance and noise measurements. The tool offers a unique ability to eliminate and detect open circuits. It can also detect shorts, contact continuity and leakage between adjacent pads. This capability eliminates the need for multiple tests, significantly reducing testing times. UF200S comes with a built-in wafer size conversion feature. This feature ensures accurate test results, regardless of whether the substrate is an odd shape or a standard shape. The asset also includes a built-in safety spring suspension model for additional protection when isolating test nodes. TSK UF 200S is capable of handling a wide range of substrates, including thin wafers, bump bonds, and sockets. It is designed to provide the highest level of accuracy in probing and testing operations. It features a sophisticated software package that allows users to easily control and coordinate multiple testing tasks in a highly efficient manner. ACCRETECH UF200S also offers a variety of performance optimization features, such as detailed time measurements, and analytical data logging. Overall, UF 200 S is an ideal prober solution for semiconductor wafer test and probing operations. Its high-resolution CCD camera, vacuum equipment, accuracy of pressure control, and its ability to convert wafer sizes make it the perfect solution for any application. It offers a wide range of testing and probing capabilities, allowing users to accurately and quickly analyze and measure wafer characteristics.