Used ACCRETECH / TSK UF 200S #9365976 for sale
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ID: 9365976
Vintage: 1997
Prober
Non-functional parts:
Z-Unit (Bearing has deteriorated)
Y-Axis moire scale
1997 vintage.
ACCRETECH / TSK UF 200S is a prober that is used to probe and analyze wafers and substrates in a semiconductor laboratory setting. The prober is a fully automated device that utilizes a live feedback equipment to accurately locate the wafer, and a high-precision linear motor stage to move the prober. It features a 30Kg capacity, which is capable of handling heavy wafers and substrates. The prober is equipped with a dustproof vision system and EFEM (Equipment Functional Electrical Model) which is used to measure, align and calibrate the probes. Additionally, it contains a number of different types of probes for different applications, depending on the type of wafer or substrate being tested. The probes can be manually changed, and the calibration and alignment process is also automated. The prober is configured to accept external data from a variety of sources, including visual systems, embedded software, and CAD or CAD/CAE tools, as well as EDFA (Encoder Digital Frequency Analyzer) and other detectors. This allows the data to be integrated with the prober to create an accurate and efficient wafer testing unit. Additionally, the prober is capable of utilizing the embedded software for a variety of automated testing including: programming, multi-site testing, Device Indexing and analysis, reticle analysis and verification, electrical test, optical and XRD analysis, parametric testing, localization measurements and S/N analysis. TSK UF200S has also been designed with a number of different safety options, including an auto-detection machine which alerts the user of potential safety hazards, as well as a user-defined emergency stop tool for emergency situations. Additionally, the prober has various microscope zoom and focus options, as well as a variety of prober chuck, wafer cassette and sample holder options. Overall, ACCRETECH UF 200 S is a reliable and versatile prober that enables efficient testing of a variety of wafers and substrates. It is equipped with a number of features that ensure accurate testing and data collection, as well as safety features that provide the user with a secure atmosphere while they are conducting their tests.
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