Used ACCRETECH / TSK UF 200S #9365979 for sale

ACCRETECH / TSK UF 200S Prober is a fully automatic wafer probe station designed for testing integrated circuits. This equipment automatically locates and positions substrates for testing and provides wafer mapping capabilities. It is ideal for probing a wide variety of semiconductor substrates, including slices and chips on a single BT (BT= solder paste) card. Using its integrated environmental control system and fast thermal cycling, TSK UF200S Prober can maintain a consistent temperature across the wafer surface, allowing easy topography scanning and wafer dicing. Its automated wafer positioning unit offers fast, accurate alignment across the entire wafer surface and delivers repeatable data in production and engineering applications alike. The prober includes four large chuck plates and two small chuck plates that can accommodate a range of substrates. An integrated contact sensor and alignment camera are used to ensure accurate, repeatable probe positioning and alignment. ACCRETECH UF 200 S machine is designed for high-precision calibration and measurement, and it supports variable probe tips and custom contactor parameter control. ACCRETECH UF 200S Prober is equipped with a patented fast cycle time feature that eliminates the need for additional instrumentation and dramatically reduces probe time. This feature also produces better wafer-level testing and characterization results, including on-wafer probing and off-wafer measurements. TSK UF 200S Probing Tool is supported by a comprehensive suite of software tools, including programs for mapping, electrical test data collection and analysis, wafer sorting, and reverse engineering. By providing a fully automated and integrated test environment, this asset eliminates manual intervention and errors and improves efficiency. TSK UF 200 S Prober is an excellent choice for use in production operations, quality assurance, DFx, and characterization tasks in electronics manufacturing and research laboratories. Its combination of environmental control, high-precision calibration, repeatable data, and fast cycle time make it an invaluable asset in any advanced testing and characterization application.