Used ACCRETECH / TSK UF 200SA #293615298 for sale

ACCRETECH / TSK UF 200SA Prober is a wafer probing equipment designed for use in the semiconductor manufacturing process. The prober utilizes a unique, modular design that allows for easy configuration and flexibility, offering superior data accuracy and reliability. The prober is configured with a robust wafer-handling system and a fully automated x-y, z-axis and theta stage unit. The x-y stage has a resolution of 1.0 to 8.0 μm and a travel distance of 4.0 to 6.0 cm. The z-axis has a resolution of 1.0 μm to 10.0 μm and a travel distance of 20.0 mm. Additionally, the prober is equipped with a DC wafer-stage-clamping machine for high repeatability during wafer positioning and mapping. The prober includes an 8" inspection tester with an adjustable contact force, a multiple-point electrical measurement tool, and a powerful data-acquisition asset. The tester is capable of performing various electrical measurements such as voltage/current, capacitance/impedance, scalar/vector, contact resistance and ESD testing. Additionally, the tester is equipped with an integrated laser interferometer for precise sample position measurement and a fault locator for pinpointing defective wafers. The prober also includes four microscopes with magnifications ranging from 2x to 20x, allowing for extensive vision and imaging testing. The microscopes are equipped with an integrated vision model for automated wafer-mapping acquisition, analysis and visualization. TSK UF200SA Prober is designed to meet a variety of production and research needs and is suitable for a wide range of industries such as automotive, semiconductor memories, displays and microelectronics chips. The prober is capable of testing and inspecting up to 20 wafers per second with a throughput of 300 wafers per hour. Additionally, the prober is equipped with a wafer-load/unload equipment for easy operation. ACCRETECH UF 200 SA Prober is a reliable and efficient wafer-testing and inspection system suitable for use in the semiconductor industry. It is configured with a robust wafer handling unit, a powerful data acquisition machine, and a variety of vision and imaging testing options, making it an ideal choice for the production environment. The prober is suitable for a variety of production needs and is capable of testing and inspecting up to 20 wafers per second with a throughput of 300 wafers per hour.